Resonant soft x-ray scattering from hard and soft condensed matter
By Jeff Kortright from Materials Sciences Division from Lawrence Berkeley National Laboratory
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| When |
Jun 08, 2011 from 04:00 am to 05:30 am |
| Where | ALBA, Rowe Meeting Room |
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Broadly speaking, resonant x-ray scattering aims to combine the structural sensitivity of angle-resolved scattering with the element-resolved sensitivity to electronic structure, as distinct from electron density, in order to study the spatial distribution of chemical or functional properties. The soft x-ray spectral region (roughly 200 – 2500 eV) contains strong, sharp core levels of many key active elements in a range of important materials, including 3d transition and rare earth elements as well as C, N, and O that constitute organic molecules. Wavelength-limited spatial resolution at these edges ranges from several nanometers to sub-nanometer. This talk will illustrate the value and potential of resonant soft x-ray scattering in both hard and soft condensed matter. Examples presented will draw from studies of magnetic domains in films with perpendicular anisotropy [1-5], dipolar interactions in superparamagnetic nanoparticle assemblies [6], exchange-coupled systems [7,8], the SrTiO3 (001) near-surface region [9], and polymer films [10-12]. We will also consider some of the technical and analytical details related to measuring and interpreting resonant soft x-ray scattering data.
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6. J. B. Kortright, et al., Phys. Rev. B 71, 012402 (2005).
7. O. Hellwig, J. B. Kortright, K. Takano, and E. E. Fullerton, Phys. Rev. B 62, 11694 (2000).
8. S. Roy, et al., Phys. Rev. Lett. 95, 047201 (2005).
9. S.M. Valvidares, M. Huijben, P. Yu, R. Ramesh, and J.B. Kortright, Phys. Rev. B 82, 235410 (2010).
10. G. E. Mitchell, et al., Appl. Phys. Lett. 89, 044101 (2006).
11. J. M. Virgili, et al., Macromolecules 40, 2092 (2007).
12. M. Mezger, et al., Phys. Rev. B 83, 155406 (2011).

