Dr. Marion Kuhlmann; LLS, Barcelona

Small-angle X-ray scattering (SAXS) is a standard method for the non-destructive analysis of microstructure on the nanometer scale with synchrotron radiation. Many soft-condensed-matter materials (e.g. natural fibers, polymer fibers, wood) are nanostructured, and their properties are a result of this structure. Frequently the nanostructure is varying across the specimen to be studied and here the combination of SAXS with microtomography opens up new possibilities for a non-destructive study of complex materials. The result is a mosaic of SAXS patterns, which are associated to definite volume elements from the specimen. These reconstructed patterns can be analyzed in order to track the variation of nanostructure inside the sample. Grazing incidence small-angle scattering (GISAXS) analyzes the morphology of homogeneous surfaces and thin layers containing nanometer-sized particles or structures. In contrast to other well-established surface sensitive microscopy techniques, such as atomic force microscopy or scanning electron microscopy, GISAXS measurements have the advantage of being depth sensitive. Therefore, this technique is not limited to surface studies only, but also allows for probing buried layers and interfaces. The talk presents different kind of samples and experiments to demonstrate the development of SAXS and GISAXS Microtomography.