Dr. William Jeff Corbett; SLAC, Stanford, USA

Visible beam diagnostics are an important component to electron storage ring commissioning and characterization. At SPEAR-III an unfocused beam is directed to an optical bench where a variety of measurement techniques are applied. We will describe basic components of the beam line and the diagnostic stations including streak camera, fast-gated imaging camera, a visiblelight interferometer and intensity-fluctuation measurement system. Examples include bunch-lengthening with single-bunch current, extraction of impedance, operation in the low-alpha (short bunch mode, including bursting) and use of a rotating camera to record turn-by-turn beam size. Applications of an x-ray beam pinhole camera are also discussed.