ALBA Synchrotron

English.

Micro-Raman

OBJECTIVE

SPECIFICATIONS 

5XVIS

5X visible objective, NA = 0.10, WD = 19.6 mm

10XVIS 

10X visible objective, NA = 0.25, WD = 10.6 mm 

100XVIS 

100X visible objective, NA = 0.90, WD = 0.21 mm 

50XLWDVIS

50X LWD visible objective, NA = 0.50 WD = 10.6 mm 

XY-Stage

Mapping and Depth Profile Options 

Kit-XYZ-Plus-HRevo

Full kit for sample positioning. Includes XY motorised stage (X = 75mm, Y = 50mm) and motorised Z device for BX and BXFM microscopes controlled by LabSpec software.
XY specifications :  repeatability  ≤ 1µm ; accuracy  ±1µm ; resolution encoder 50nm
(minimum step : 10nm, encoder disabled).
Z specifications : resolution (minimum step size) = 0.01µm.
Includes positioning joystick, external controller, software package and Raman AutoFocus capability.
Includes the Standard SWIFT fast confocal imaging - SWIFT FAST Confocal Raman Image generation module. Innovative high speed Raman acquisition mode suited for fast mapping applications.

LASER

LASER OPTIONS 

KIT-633-17-Hrev

HeNe laser kit 633nm/17 mW, including the Helium Neon laser internally mounted, the Edge and bandpass filters set at 633 nm for Raman measures from 50 cm-1 and PL measures up to CCD limit and the motorized switching system to allow the laser commutation fully controlled by LabSpec 6 software. 

KIT-532-100-Hrev

532 nm laser kit including air cooled frequency doubled Nd:Yag laser, narrow bandwidth (532 nm / 100 mW / 1 MHz)., Edge and bandpass filters set at 532 nm for Raman measures from 50 cm-1 and PL measures up to CCD limit, motorized optics for commuting fully controlled by LabSpec 6 software. 

KIT-785-100-Hrev

785 nm laser kit including air cooled intra cavity regulated laser diode with point source for maximal confocal performance (785 nm/ 100 mW), Edge and bandpass filters set at 785 nm for Raman measures from 50 cm-1 and PL measures up to CCD limit, motorized optics for commuting fully controlled by LabSpec 6 software. 

An additional set of low frequency are available for 633 nm allowing to measure from 5 cm-1

GRATING

Specifications 

300

300gr/mm ruled grating blazed at 600 nm 

600 

600 gr/mm holographic grating blazed at 500 nm (spectral range 360-1250nm) 

1800

1800 gr/mm holographic grating blazed at 500 nm (spectral range 325-900nm)

2400 

2400 gr/mm holographic grating blazed at 400 nm (spectral range 250-800nm)

LASER

300

600

1800

2400

532 nm 

8-12 cm-1

4-6 cm-1

1.5-2.2 cm-1

< 1.2 cm-1

633 nm 

6-10 cm-1

3-5 cm-1

1.2-1.5 cm-1

< 1.0 cm-1

785 nm

4-8 cm-1

2-4 cm-1

<1.0 cm-1

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Different quartz cell to make experiment with liquids, from 60 uL up to 100 ml

Full control over incident polarization using half and quarter plates

Nano-Raman

Scanning Probe Microscope (SPM) and optical coupling platform featuring:

Full performance SPM capabilities: Available AFM modes: Contact, Semi-Contact, Non-Contact, Lateral Force Microscopy (LFM), Piezo Force Microscopy (PFM), Phase contrast, Magnetic Force Microscopy (MFM), Single- Pass MFM, Electrostatic Force Microscopy (EFM), Single-Pass EFM, Scanning Kelvin Probe Microscopy (SKM), Scanning Capacitance Microscopy (SCM), Nanolithography.

  • Top/side optical access for external laser illumination:
    • Top optical access with objective lens up to 100x 0.7NA for co-localized optical measurements.
    • Simultaneous optical access for top objective (10x 0.28NA) and side objective (50x 0.55NA), and 100x 0.7NA objective).
  • Low vibration-sensitive setup with short laser-to-tip optical pathway (<800 mm for all lasers).
  • High speed flexure based closed loop SPM XYZ scanner (15kHz in Z) with 100x100x15 micron scan range.
  • Motorized XY stage 5x5mm on SPM platform.
  • Registration AFM system noise less than 0.1 nm.
  • Fully automated AFM feedback laser and AFM photodiode sensor alignment, bringing hands-free operation.
  • Fully automated cantilever re-alignment after tip exchange.
  • Infrared 1300nm AFM feedback laser, allowing interference-free operation with all spectroscopy lasers in the visible-NIR range (532, 633 and 785nm) using a spectrometer with silicon CCD detector.
  • Integrated USB colour camera for simultaneously visualizing the sample and laser spot.
  • TERS-ready setup for Tip Enhanced Raman Scattering.
  • Objective scanner for Mitutoyo objective (100X and 50X):
    • XYZ objective closed loop piezo-scanner with capacitive sensors and flexible guides.
    • Scanning range 30x30x15 µm.
    • Protection enclosure, for gas environmental control.