Abstract

The SMIS spectromicroscopy beamline aims to deliver high brilliance infrared radiation in the 2.5-100 microns spectral range. The synchrotron beam is split to operate two systems working in parallel. The beamline is dedicated to microscopic analysis of a variety of samples, spanning from polymer films and multilayers, minerals and other geological materials, biological and biomedical samples, to archaeology. An ensemble of experimental cells are provided and adapted to accommodate various needs allowing experiments at various temperature and pressure conditions, under mechanical stress, etc. Besides working with commercially available equipment adapted to the synchrotron source, the SMIS beamline is a world leading facility in custom built IR instrumentation. With our newest developments the beamline extends its capabilities from diffraction limited spatial resolution to several tens of nanometers resolution and from single point mapping to large area imaging. I will discuss both the coming developments as well as the current capabilities of the beamline via highlighting user experiments relevant to the individual techniques.