Access to the system is strictly conditioned to:
- Prior validated training
- Mandatory reading and understanding of protocols
- Authorization by responsible laboratory personal.
General System Operation | Complementary Surface Characterization | Vacuum and UHV Conditions | Sources and Deposition |
|---|
- SPM and Nanonis electronics power on/off
- Initial system status verification (vacuum, electronics, communications)
- Software and controller initialization
| - RGA (Residual Gas Analysis)
- Low-Energy Electron Diffraction (LEED)
- Auger Electron Spectroscopy (AES)
- Quartz Crystal Microbalance (QCM)
| - Start pumping / pump-down
- Bake-out (preparation, execution, cooldown)
- Controlled venting (N₂)
- System degassing
- Leak checking and valve/interlock operation
| - Evaporators
- Kim evaporator
- 4×OMBE source
- Power supply (Fug)
- Thermocouples
|
Sample Handling and Transfer | Electronics and Control (Nanonis) | Sample Preparation | Critical Components and Instrumentation |
|---|
- Load-lock loading/unloading
- Inter-chamber transfer:
- load-lock → preparation → analysis
- Use of manipulators (transfer rods, wobble stick)
- UHV suitcase transfers (currently in preparation)
| - Module configuration: RC4, SC4, OC4, HVS4, HVA4, AKAH
- Communication verification:
usb, ethernet, analog signals - Channel configuration and data acquisition
- Associated protocols: electrical maintenance, LabView2016
| - Ion sputtering (Ar⁺) - annealing cycles
- Tip sputtering / tip cleaning
- Heating (e-beam: Kentax)
- Gas dosing (leak valve) Sample handling procedures
| - Ion source filament
- Kolibri sensor replacement
- Heater filaments (tungsten thorium)
- Maintenance: Scroll and turbomolecular pumps.
- Spot welding
|
SPM Operation (STM / nc-AFM) | System Maintenance | Spectroscopy and Local Characterization | Operational Safety |
|---|
- Tip approach and retraction (coarse motor)
- Feedback parameter tuning (PID)
- Bias, current, and Δf configuration
- Amplitude calibration
- Scanning and image acquisition
- Associated protocols: scanning nc-AFM/STM, amplitude calibration
- Topographic calibration of XYZ piezo scanners
| - Component degassing
- Tip cleaning (sputtering)
- Inspection of electrical and vacuum connections
- Cleaning of sample holders
- Alumina crucible replacement in the OMBE source
- Degassing of molecular compounds
- Optimization of sputtering-annealing parameters and spatial alignment
| - Bias spectroscopy
- I–V measurements (IVs)
- Z-spectroscopy (I–z, Δf–z)
- Grid / mapping spectroscopy
| - Mandatory PPE (gloves, goggles, thermal protection)
- Safe handling of high voltage systems (Fug, e-beam)
- Emergency procedures (vacuum, electrical, thermal events)
|
