It houses two AFM systems model FX40 (Park Systems) that enable advanced nanomechanical and electrical measurements. One of the AFMs (SM03) is installed inside a glove box, allowing experiments under inert argon atmosphere, which is essential for studying air-sensitive samples and processes.

Both instruments allow automatization of the probe exchange that allow correlative measurements using different AFM modes (and employing different probes) on the same location of the sample.

Atomic Force Microscopy modes

• Contact mode
• Dynamic mode
• Friction Force Microscopy (FFM)
• Electrostatic Force Microscopy (EFM)
• Kelvin Probe Microscopy (KPFM)
• Piezoresponse Force Microscopy (PFM)
• PinPoint AFM
• Conductive AFM (C-AFM)