• Capable of operating between 30 and 300 keV.
• With a spatial resolution of 39 pm at 300 keV and sub-angstrom resolution above 60 keV to visualize structures and processes at the atomic scale.
• With an exceptional energy resolution, below 25 meV, to facilitate precise characterization of electronic properties and chemical bonding within materials.
• Incorporating 4D STEM capabilities through the CMOS camera and pixelated direct electron detector to enable comprehensive spatiotemporal analysis.
• Including a high-collection-angle Energy Dispersive X-ray Spectroscopy (EDX) system that enables rapid and accurate composition mapping down to atomic resolution.
• Integrating an Electron Energy Loss Spectroscopy (EELS) system to ensure fast acquisition of high-energy resolution spectra, enabling detailed analysis of electronic structure and bonding configurations in materials.
• Complemented by sample holder systems for catalysis, electrochemistry, and temperature-dependent in-situ experiments for controlled environments such as gas mixing and flow, liquid flow with biasing on electrodes, and precise temperature control ranging from -160 to 800 ºC.
• Complete sample preparation room adjancent to the microscope.