• Integrating complementary scanning probe and optical nanoscale techniques for versatile materials characterization.
• Including 5 instruments:
• 2 multimodal AFMs from Park Systems, providing state-of-art multi-technique AFM (KPFM, MFM, EFM, LFM, PFM, SCM, Phase contrast, C-AFM, ECM) capability. One operates mainly in ambient conditions, the other one inside a glovebox, allowing high control of environment and humidity, opens new and challenging opportunities in the study of sensitive and unstable material.
• 2 optical nanospectroscopies equipment such as tip-enhanced electro and photo luminescence (STML/TEPL) or Raman (TERS), which allow mapping of electronic, magnetic, optical and chemical properties in an extremely localized manner.
• 1 ultra-high vacuum microscope, a commercial STM/nc-AFM(UHV)@RT from SPECS using a Nanonis electronics, installed at ALBA since 2011. This instrument has a load-lock for fast samples entry and is compatible with ALBA suitcases for transfer of samples under UHV.