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MIRAS is devoted to Fourier Transform Infrared (FTIR) spectroscopy and microscopy. FTIR is a very potential tool to identify the vibrational signatures and therefore the chemical composition of materials.
This beamline provides users with a modern synchrotron-based infrared spectrometer and microscope capability covering a wavelength range from about 1 µm to ∼100 µm with a spectral region optimized initially for investigation between 2.5-14 µm.
Transmission, Reflection, Attenuated total reflection (ATR) and Grazing incidence are the most important geometries for sample analysis, and are all available at the beamline.
Technical Specifications
Source | Bending magnet - Full emission from the two main sources of radiation, edge and constant field of the bending magnet with opening angle of 43 mrad horizontal and 25.17 mrad vertical |
Energy range | ~ 1.2 µm to 100 µm |
Energy resolution | 0.2 cm-1, (0.012meV) and higher ( up to 16 cm-1) |
Flux on sample | Approx. 4 e+13 Ph/s/0.1%bw@ 10 µm for 250 mA stored current or 8x10-7 W/cm-1 |
Beam size at sample position (full beam) | ~ 10x10 µm2 with a x36 objective |
Projected Aperture size | From 3x3µm2 and higher |
Polarization properties | Quasi-linear polarization from constant field emission of bending magnet, combined with radial polarization from edge radiation emission |
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