Hard X ray micro-spot beamline operated between 2 keV to 17 KeV that will perform core level ambient pressure photoelectron spectroscopy (APXPS) and Surface X ray diffraction (SXRD) at grazing incidence angles (from 0 up to 15º).

The energy resolution of this beamline is~2.5x10-5 deltaE/E for the full energy rage. The beamline will be operated up to 10 bar local partial pressure (virtual cell operation), and up to 100 mbar total partial pressure (back-fill main chamber operation). The system will be fully vacuum-compatible down to UHV conditions. The endstation will be compatible with electrochemical experiments. The performance of the beamline is optimized for ALBA II.

3Sbar is a beamline that contributes to a better understanding of the processes that take place on the solid-gas/solid-liquid/liquid-gas/solid-solid interfaces. The beamline combines two surface sensitive techniques simultaneously. Chemical information will be gathered with X-ray photoelectron spectroscopy (XPS) and structural information by surface X-ray diffraction (SXRD). By operating under industrially relevant conditions, the dynamics of complex environments as a function of pressure, gas composition, temperature, voltage, light, and more can be determined. The beamline is designed to close the pressure gap; the discrepancy between the higher pressures needed for investigating processes at relevant conditions and the lower pressures typically available.

3Sbar is a cutting-edge beamline that aims to provide a fundamental understanding of chemical and structural composition for a broad panel of surface science processes. Such information is key in many research topics such as batteries, catalysis, electrocatalysis, corrosion, sensors, atmospheric chemistry, nitrogen fixation, 2D material fabrication, tribology, and more. The problems this beamline can address are relevant to a global strategy to achieve more efficient, clean, and environmentally friendly technologies. 3Sbar will enable new insights into fundamental understanding at the atomistic scale, advancing key technologies. Researchers will be able to drive forward important investigations, from the efficient use of energy to its conversion and beyond.

Techniques available

Simultaneous Hard X-ray Photoelectron Spectroscopy (HAXPES) and surface X-ray diffraction (SXRD)

Research Area

  • Energy
  • Environment
  • Device engineering

Technical specifications

Parameter

Value for alba

value for alba ii

Energy range

2 to 17 keV

2 to 17 keV

Flux at 5 keV

7.13x1012 ph/s

1.76x1013 ph/s

Resolution at 5 keV

126 meV

128 meV

Spot size on sample (H x V)

8.6 x 2.4 µm2 fwhm

1.27 x 3.66 µm2 fwhm

Divergence on Sample (H x V)

1.56 x 0.35 mrad2 fwhm

0.76 x 0.30 mrad2 fwhm

Latest publications

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UE Next Generation CAT

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This beamline is funded by the Recovery, Transformation and Resilience Plan within the framework of NextGenerationEU.