Sample temperature during measurement

7K - 300K

Yes

Sample height

0mm - 4mm

Height with respect to sample holder surface

Sample size

Max size: 5mm x 5mm

For samples fixed with clamps. Larger samples are possible if glued, see sample holder drawings

Sample motions in measurement posiiton

X=±5mm ,Y=±2mm, Z=±7mm, Polar=-25deg to +40deg, Azimuth= -80deg to +80deg, Tilt= -15deg to +30 deg

Sample position control

Microscope with spatial resolution = 10µm, beam position reference

Sample preparation

Cleave in analysis chamber

Yes

Either with kapton tape or with top-post

Sputtering-annealing

Yes

In preparation chamber (Ar+ sputtering, T up to 1200K)

Annealing

Yes

In organic chamber T up to 700K

Annealing in O2 atmosphere

Yes

In organic chamber T up to 700K, P up to 10^-4mbar

O2 plasma

Yes

In organic chamber

Thin film evaporation (various elements or compounds)

Yes

In preparation and organic chamber

Li evaporation

Yes

In preparation chamber @ RT or LN2 temperature // On measurement manipulator @ LHe temperature

Other alkali getters

Yes

Rb and K in preparation chamber @ RT and LN2 temperature

ALD

Commissioning

Ask BL staff for details

Sample characterization

LEED (with Auger spectroscopy)

Yes

In preparation chamber @ RT

mini-LEED

Yes

On measurement manipulator @ LHe temperature

Sample holders

ox-free Cu, Ta, W, V, Mo

Yes

Cu sample holders not heatable

Operando environment

Sample holder with 4 electrical contacts

Yes

For sample gating during ARPES or in-situ 4 contacts transport characterization

Sample loading and storage

6 samples in load lock + 12 samples in storage chamber

Yes

Transfer from UHV suitcase

Through storage chamber

Yes

For UHV specification contact the BL staff

ARPES analyser type

220mm hemispherical analyser with horizontal slit. Motorised slit motion in X and Y directions.

ARPES analyser energy range

10eV - 650eV 2D angle resolved (with mechanical deflector)

Yes

10eV -900eV angle resolved (fixed deflector)

Yes

ARPES analyser energy resolution

See Table

ARPES analyser angular modes

±3.5deg, ±7deg, ±15deg, ±17deg (magnified)

ARPES analyser spatial mode

±2.5mm

Used for analyser focus and beam position adjustment

ARPES analyser slit apertures

See Table

Data format ARPES

.nxs, .krx, .dat

Yes

.nxs main data format, see file tree

see Au(111) @ 415eV measurement

IgorPro procedures available for .krx data loading

Software for online visualization/analisys

Silx view, NavARP

Silx view

NavARP view

Spin-ARPES analyser type

VLEED with 1 Fe-O target, 2 magnetization directions

Spin-ARPES energy range

10eV - 500eV

Yes

with PE=10eV, 20eV, 30eV, 40eV

Spin-ARPES spin components

6 components (+X, -X, +Y, -Y, +Z, -Z)

Yes with restrictions

Either with 2 different target magnetization or with spin manipulator

Spin-ARPES energy and angular resolution

See Table

Absorption with TEY

10eV - 1000eV

Momentarily not available

Sample drain current

Absoprtion with PEY

50eV - 1000eV

Yes

With electron analyser, either CIS or CKE

Resonant Photoemission

50eV - 900eV

Yes

Data format spin-ARPES

.krx, .dat

Yes

IgorPro procedures available for data visualization and analysis