NCD-SWEET beamline is devoted to Small and Wide Angle X-ray Scattering in transmission (SAXS & WAXS) and Grazing Incidence Small and Wide Angle X-ray Scattering (GISAXS & GIWAXS)

The beamline covers two techniques:

  • Small and Wide Angle X-ray Scattering in transmission (SAXS & WAXS). SAXS  is a technique used to study the structure and morphology of materials at the nanoscale. It involves scattering X-rays at small angles (< 5 degrees) and analyzing the scattered pattern to determine information about particle size, shape, and arrangement. Complementarily, WAXS provides information about crystal structures, phase transitions, and atomic ordering in materials by recording large scattering angles (> 5 degrees). Recording simultaneously SAXS and WAXS results in a length scale which ranges from a few microns to a few angstroms.
  • Grazing Incidence Small and Wide Angle X-ray Scattering (GISAXS & GIWAXS). The grazing incidence configuration fulfills the necessity to investigate nanoscale objects at surfaces, buried interfaces or in thin films using a grazing incidence X-ray beam (< 1 degree). GISAXS provides information about the size, shape, and arrangement of nanoscale structures, while GIWAXS provides detailed information about the crystallographic structure, orientation, and phase transitions within the material.

These techniques are commonly used in various fields, including materials science, chemistry and biology. As illustration, a non-comprehensive list of examples of systems and materials that can be studied at NCD-SWEET beamline using the X-ray scattering technique are: biomaterials, biological macromolecules, catalysts, ceramic materials, colloids, energy materials (solar cells, batteries), fibers, geological materials (minerals, rocks), inorganic nanomaterials, lipid bilayers, liquid crystals, membranes, mesoporous materials, nanocomposites, nanoparticles, paints and coatings, pharmaceuticals (amorphous and crystalline forms), porous materials, self-assembled monolayers, soft matter systems, supramolecular assemblies, surfactants and emulsions,thin films and multilayers.

Energy Range

0.62 - 1.90 Å / 6.5 -20 keV

Research Area

  • Materials Science
  • Chemistry
  • Biology

Technical specifications

Wavelength range/Energy range

0.62 - 1.90 Å / 6.5 -20 keV

Flux at sample position

> 1.5·1012 ph/s at 12.4 keV @ 150 mA

Bandpass (ΔE/E)

2.7 10-4 at 10.0 keV

Beam size at sample position

130 µm x 130 µm (H x V)

Sample detector distance

2.1 - 7.2 m (SAXS) | < 300 mm (WAXS)

How to download the data

Check out section 4 to access remotely to your experimental data

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