Techniques available
- Photoemission electron microscopy (PEEM)
- Near-ambient pressure photoemission (NAPP)
ALBA Synchrotron
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Variable polarization soft X-ray beamline dedicated to advanced photoemission experiments. It has two endstations: PEEM (photoemission electron microscopy) and NAPP (near ambient pressure photoemission).
A plane grating monochromator covering the energy range 100 - 2000 eV is shared between two independent branches (PEEM and NAPP). A couple of deflecting mirrors directs the beam to one branch or to the other.
Relevant results have been obtained in XPS-PEEM, XMC(L)D-PEEM, IV-LEEM and u-LEED modes, combining state of the art spatial resolution with spectroscopic measurements (spectromicroscopy). Since then, the beamline control system has been continuously updated to improve acquisition speed and user friendliness. Electrical poling experiments with out-of-plane fields and in-plane electrodes have been performed and sample holders with in-situ electromagnets (in-plane, out-of-plane, biaxial in-plane and combined in-plane/out-of-plane) have been added. We continue the beamline and endstation development according to user needs.
Regarding the NAPP endstation, important results have been obtained in catalysis and surface science. Since April 2014, the Peltier cooling system is also operative. A gas line for dosing CO into the analysis chamber is operative since 2015.
Technical specifications
Photon energy | 100 - 2000 eV |
Polarization | Variable |
Energy resolution | ~ 8000 |
Photon flux | ~ 1013 ph/s |
Beam spot size at PEEM position (VxH) (FWHM) | variable, min 3.2 x 36 µm2 |
Beam spot size at NAPP position (VxH) (FWHM) | ~ 20 x 100 µm2 |
How to download the data
Check out section 4 to access remotely to your experimental data
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