
SM01 - STM/nc-AFM
Advanced scanning probe microscopy (SPM) platform based on the Aarhus 150 system, specifically engineered for atomic-scale characterization under ultra-high vacuum (UHV) conditions. The system integrates both scanning tunneling microscopy (STM) and non-contact atomic force microscopy (nc-AFM) modes, enabling complementary access to the electronic structure and short-range interatomic interactions at surfaces.


