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Materials Characterization Techniques for XRD and XRF

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The aim of this scientific-technical workshop is an up-to-date overview of the principal in-house X-ray diffraction and X-ray fluorescence techniques for materials characterization. Part of the workshop will be also devoted to the technical description of the new equipment of RIGAKU.
When
May 19, 2014 from 07:00 AM to 12:00 PM (UTC / UTC0)
Where
ICMAB-CSIC, UAB Campus
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