Abstract

The seminar will focus on the use of X-rays for the structural characterization of electrochemical systems in operando and in-situ conditions. In particular the capabilities of surface diffraction and grazing incidence diffraction techniques for the multiscale analysis of thin films growth, electrodeposition, corrosion and electrocatalytic processes will be presented. The seminar will offer also a context of the evolution of the surface diffraction techniques during the recent years and a point of view on the latest trend and possible future developments in the field.