Abstract

Surface chemistry at solid surfaces is one of the most active research fields on Surface Science using infrared spectroscopy. The studies at metallic interfaces ( p-polarization in grazing incidence)  are achieved either in UHV conditions, with time resolution of few tens of seconds, or using polarization-modulation reflection absorption spectroscopy for near-ambient to higher pressure studies. Surface chemistry at oxide interfaces has also be probed and, for semiconductors interfaces, several geometries (in particular multiple internal reflection) can be employed, providing high sensitivity for interfaces studies. All approaches allow time-evolved studies at interfaces.

Photoelectron spectroscopy in near-ambient pressure and IR spectroscopy appear then very complementary, especially if they can be operated simultaneous on the same sample in the same environment. The combination of these two techniques in the same chamber for simultaneous analysis will be discussed for metallic, semiconductors and oxide surfaces. The spatial resolution matching and the potential advantage of using a synchrotron infrared beam will be addressed.